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LOW-VOLTAGE FUSES - PART 4: SUPPLEMENTARY REQUIREMENTS FOR FUSE-LINKS FOR THE PROTECTION OF SEMICONDUCTOR DEVICES (FIRST REVISION) (IEC 60269-4:2009, IDT)
MS IEC 60269-4:2011
Status : 1st Revision
Format : PDF

This Malaysian Standard applies to fuse-links for application in equipment containing semiconductor devices for circuits of nominal voltages up to 1 000 V a.c. or 1 500 V d.c. and also, in so far as t ....Read more hey are applicable, for circuits of higher nominal voltages. Close

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LOW-VOLTAGE FUSES - PART 1: GENERAL REQUIREMENTS (IEC 60269-1:1998, IDT)
MS IEC 60269-1:2005
Status : Original
Format : PDF

This Malaysian Standard is applicable to fuses incorporating enclosed current-limiting fuse-links with rated breaking capacities of not less than 6 kA, intended for protecting power-frequency a.c. cir ....Read more cuits of nominal voltages not exceeding 1 000 V or d.c. circuits of nominal voltages not exceeding 1 500 V. Close

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Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices (Second revision) (IEC 60269-4:2009, AMD. 1:2012, AMD. 2:2016 CSV, IDT)
MS IEC 60269-4:2017
Status : 2nd Revision
Format : PDF

This Malaysian Standard is to be used in conjunction with IEC 60269-1. This Part 4 supplements or modifies the corresonding clauses or subclauses of Part 1. Fuse-links for the protection of semiconduc ....Read more tor devices shall comply with aIl requirements of IEC 60269-1, if not otherwise indicated hereinafter, and shall also comply with the supplementary requirements laid down in the standard.

These supplementary requirements apply to fuse-links for application in equipment containing semiconductor devices for circuits of nominal voltages up to 1 000 V a.c. or 1 500 V d.c. and also, in so far as they are applicable, for circuits of higher nominal voltages.
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Electrical relays - Part 21: Vibration, shock, bump and seismic tests on measuring relays and protection equipment - Section 3: Seismic tests (IEC 60255-21-3:1993, IDT)
MS IEC 60255-21-3:2012
Status : Original
Format : PDF

This Malaysian Standard specifies the vibration, shock, bump and seismic requirements applicable to electromechanical and static measuring relays and protection equipment, with or without output conta ....Read more cts. Close

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Electrical relays - Part 21: Vibration, shock, bump and seismic tests on measuring relays and protection equipment: Section Two - Shock and bump tests (IEC 60255-21-2:1988, IDT)
MS IEC 60255-21-2:2012
Status : Original
Format : PDF

This Malaysian Standard specifies the vibration, shock, bump and seismic requirements applicable to electromechanical and static measuring relays and protection equipment with or without
output ....Read more contacts.

This standard includes two types of test:-the shock test (on energized and non-energized specimen); - the bump test (on non-energized specimen), and is generally based on IEC 68-2-27 and 68-2-29.The requirements of this standard are applicable only to measuring relays and protection equipment in new condition. The tests specified in this standard are type tests.
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Electrical relays - Part 21: Vibration, shock, bump and seismic tests on measuring relays and protection equipment - Section One: Vibration tests (sinusoidal) (IEC 60255-21-1:1988, IDT)
MS IEC 60255-21-1:2012
Status : Original
Format : PDF

This Malaysian Standard is part of a series specifying the vibration, shock, bump and seismic requirements applicable to measuring relays and protection equipment (with or without contacts).
....Read more r /> This standard includes two types of vibration tests: the vibration response test and the vibration endurance test, and is generally based upon IEC 68-2-6.

The requirements of this standard are applicable only to measuring relays and protection equipment in a new condition.The tests specified in this standard are type tests.
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Measuring relays and protection equipment - Part 151: Functional requirements for over/under current protection (IEC 60255-151:2009, IDT)
MS IEC 60255-151:2012
Status : Original
Format : PDF

This Malaysian Standard specifies minimum requirements for over/under current relays. It includes a specification of the protection function, measurement characteristics and time delay characteristics ....Read more . Defines the influencing factors that affect the accuracy under steady state conditions and performance characteristics during dynamic conditions. Close

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Measuring relays and protection equipment - Part 127: Functional requirements for over/under voltage protection (IEC 60255-127:2010, IDT)
MS IEC 60255-127:2012
Status : Original
Format : PDF

This Malaysian Standard specifies specifies minimum requirements for over/under voltage relays. The standard includes specification of the protection function, measurement characteristics and time del ....Read more ay characteristics. Close

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Insulating liquids - Measurement of relative permittivity, dielectric dissipation factor (tan ?) and d.c. resistivity (IEC 60247:2004, IDT)
MS IEC 60247:2012
Status : Original
Format : PDF

This Malaysian Standard describes methods for the determination of the dielectric dissipation factor (tan ?), relative permittivity and d.c. resistivity of any insulating liquid material at the test t ....Read more emperature.

The methods are primarily intended for making reference tests on unused liquids. They can also be applied to liquids in service in transformers, cables and other electrical apparatus. However the method is applicable to a single phase liquid only. When it is desired to make routine determinations, simplified procedures, as described in Annex C, may be adopted.

With insulating liquids other than hydrocarbons, alternative cleaning procedures may be required.
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Electric strength of insulating materials - Test methods - Part 3: Additional requirements for 1,2/50 ?s impulse tests (IEC 60243-3:2001, IDT)
MS IEC 60243-3:2014
Status : Original
Format : PDF

This Malaysian Standard gives the requirements on the additional to those in Part 1 of this series for the determination of the electric strength of solid insulating materials under 1.2/50 µs impulse ....Read more voltage stress. Close

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