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Evaluation and routine testing in medical imaging departments - Part 3-4: Acceptance tests - imaging performance of dental x-ray equipment (IEC 61223-3-4:2000, IDT)
MS IEC 61223-3-4:2007 (CONFIRMED:2013)
Status : Withdrawn
Format : PDF

This Malaysian Standard applies to components of dental x-ray equipment using radiographic imaging systems which influence the image quality and patient dose. It applies to the performance of the acce ....Read more ptance test on dental x-ray equipment with intra-oral x-ray image receptor and dental x-ray equipment with extra-oral x-ray image receptor (for example, dental panoramic x-ray equipment or cephalometric x-ray). Close

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RADIOTHERAPY EQUIPMENT - COORDINATES, MOVEMENTS AND SCALES (IEC 61217:2000, IDT)
MS IEC 61217:2007
Status : Withdrawn
Format : PDF

This Malaysian Standard applies to equipment and data related to the process of teleradiotherapy, including patient image data used in relation with radiotherapy treatment planning systems, radiothera ....Read more py simulators, isocentric gamma beam therapy equipment, isocentric medical electron accelerators and non-isocentric equipment when relevent.  Close

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Crystalline silicon terrestrial photovoltaic (PV) modules - design qualification and type approval (IEC 61215:2005, IDT)
MS IEC 61215:2006 (CONFIRMED:2015)
Status : 1st Confirmation
Format : PDF

This Malaysian Standard specifies requirements for the design qualification and type approval of terrestrial photovoltaic modules suitable for long-term operation in general open air climates, as defi ....Read more ned in IEC 60721-2-1. It applies only to crystalline silicon modules types. A standard for thin-film modules has been published as IEC 61646. 

This standard does not apply to modules used with concentrated sunlight. The object of this test sequence is to determine the electrical and thermal characteristics of the module and to show, as far as is possible within reasonable constraints of cost and time, that the module is capable of withstanding prolonged exposure in climates described in the scope. The actual lifetime expectancy of modules so qualified will depend on their design, their environment and the conditions under which they are operated.
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LOW-VOLTAGE POWER SUPPLY DEVICES, D.C. OUTPUT - PERFORMANCE CHARACTERISTICS (IEC61204:2001, IDT)
MS IEC 61204:2007
Status : Original
Format : PDF

This Malaysian Standard describes a method for specif ying requirements for low-voltage power supply devices (including switching types) providing d.c. output(s) up to 200 V d.c. at a power level of u ....Read more p to 30 kW, operating from a.c. or d.c. source voltages of up to 600 V.The devices are for use within class I equipment or for free-standi ng operation when usedwith adequate electrical and mechanical protect ion. 
This Malaysian Standard is intended to be used for all types of a.c. or d.c. driver power supplies with any number of outputs, specially produced for an unknown final application.
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SINGLE-CAPPED FLUORESCENT LAMPS - SAFETY SPECIFICATIONS (IEC 61199 : 1999, IDT)
MS IEC 61199 : 2001
Status : Original
Format : PDF

This Malaysian Standard lEC 1199 specifies the safety requirements for single-capped fluorescent lamps for general lighting purposes of all groups having 2G7, 2GX7, GR8, GlOq, GR1Oq, GX1Oq, GY1Oq, 2G1 ....Read more 1, G23, GX23, G24, GX32 and 2G13 caps. Close

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DOUBLE - CAPPED FLUORESCENT LAMPS - SAFETY SPECIFICATIONS (IEC 61195 : 1999, IDT)
MS IEC 61195 : 2001
Status : Original
Format : PDF

This Malaysian Standard specifies the safety requirements for double-capped fluorescent lamps for general lighting purposes of all groups having Fa6, Fa8, G5, G13, 2G13, R17d and
W4.3´8.5d ca ....Read more ps.

It also specifies the method a manufacturer should use to show compliance with the
requirements of this standard on the basis of whole production appraisal in association with his
test records on finished products. This method can also be applied for certification purposes.
Details of a batch test procedure which can be used to make limited assessment of batches
are also given in this standard.
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Bayonet lampholders (First revision) (IEC 61184:2008, IDT)
MS IEC 61184:2014
Status : 1st Revision
Format : PDF

This Malaysian Standard applies to bayonet lampholders B15d and B22d for connection of lamps and semi-luminaires to a supply voltage of 250 V. 
This standard also covers lampholders which are i ....Read more ntegral with a luminaire or intended to be built into appliances. It covers the requirements for the lampholder only.

For all other requirements, such as protection against electric shock in the area of the terminals, the requirements of the relevant appliance standard shall be observed and tested after building into the appropriate equipment, when that equipment is tested according to its own standard. Lampholders for use by luminaire manufacturers only are not for retail sale. Where lampholders are used in luminaires, their maximum operating temperatures are specified in IEC 60598-1. B15 denotes the cap/holder fit as defined by IEC 60061-1, sheet 7004-11 and IEC 60061-2, sheet 7005-16 with the corresponding gauges. B22 denotes the cap/holder fit as defined by IEC 60061-1, sheet 7004-10 and IE
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HIGH-VOLTAGE TEST TECHNIQUES FOR LOW-VOLTAGE EQUIPMENT - PART 1: DEFINITIONS, TEST AND PROCEDURE REQUIREMENTS (IEC 61180-1:1992, IDT)
MS IEC 61180-1:2010
Status : Original
Format : PDF

This Malaysian Standard is applicable to: 
– dielectric tests with direct voltage;
– dielectric tests with alternating voltage;
– dielectric tests with impulse voltage;
....Read more /> – tests with impulse current;
– tests with combinations of the above.

This standard is applicable only to tests on equipment having a rated voltage of not more than 1 kV a.c. or 1,5 kV d.c. This standard is mainly applicable to type testing. It may also be applied or adapted for sample and routine testing as specified by the relevant technical committee. It is not intended to be used for electromagnetic compatibility tests on electric or electronic equipment. This standard provides the relevant technical committees as far as possible with:
– defined terms of both general and specific applicability;
– general requirements regarding test objects and test procedures;
- methods for generation and measurement of test voltages and currents;
– test procedures;
- methods for the evaluation of test results and to indi
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HIGH-VOLTAGE TEST TECHNIQUES FOR LOW-VOLTAGE EQUIPMENT - PART 2: TEST EQUIPMENT (IEC 61180-2:1994, IDT)
MS IEC 61180-2:2010
Status : Original
Format : PDF

This Malaysian Standard is applicable to the test equipment used for dielectric tests on low-voltage equipment. It covers tests with direct, alternating or impulse voltage, impulse current, and tests ....Read more with a combination of impulse voltage and impulse current. Verification procedures necessary for ensuring that the dielectric tests comply with the voltage, or current, requirements stated in part 1 of this standard in shape and magnitude are stated. The test equipment comprises a voltage and/or current generator and a measuring system. 

This standard covers test equipment in which the measuring system is protected against external interference and coupling by appropriate screening, for example a continuous conducting shield. Therefore, simple comparison tests are sufficient to ensure valid
results. Test equipment having measuring systems composed of non-screened components and/or connected by long leads is not covered in this standard. In this case guidance can be obtained from IEC 60-2
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METAL HALIDE LAMPS
MS IEC 61167:1999
Status : Original
Format : PDF

This International Standard specifies the methods of test to be used for determining the characteristics of metal halide lamps, both single-ended and double-ended, operated on a.c. mains, 50 Hz or 60 ....Read more Hz, with ballasts satisfying the requirements of lEC 923. Close

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